Failure Analysis Equipment Market to Expand at Cagr of 4.5% Between 2014 and 2020 in Semiconductor Application

A new report has been published by Transparency Market Research, titled “Failure Analysis Equipment Market - Global Industry Analysis, Size, Share, Growth, Trends and Forecast 2014 - 2020”. TMR, a market intelligence company based in the U.S., states in its report that the global failure analysis equipment market in the semiconductor industry was estimated to be worth US$1.28 billion in 2013 and is growing at a CAGR of 4.5% between 2014 and 2020.Failure analysis is termed as an engineering approach to uncover how and why a component or equipment is not working in the desired manner. For the most part, failures are brought about because of manufacturing defects, improper maintenance, assembly errors, misuse or abuse, design errors, fastener failure, improper material, unforeseen operating conditions, improper heat treatments, inadequate quality assurance, casting discontinuities, and inadequate environmental protection\control.

Browse the full Failure Analysis Equipment Market Report at http://www.transparencymarketresearch.com/failure-analysis-equipment-in-semiconductor-industry.html

According to this TMR report, on the basis of equipment, the failure analysis equipment market in the semiconductor industry is segmented into scanning electron microscope (SEM), transmission electron microscope (TEM), focused ion beam system (FIB), dual beam (FIB/SEM) systems, and transmission electron microscope (TEM). Focused ion beam system (FIB) equipment represented a large portion of worldwide market revenue in 2013, due to the diverse usage of this equipment. On the other hand, dual beam systems (FIB/SEM) are likely to develop at the highest pace in the forthcoming years owing to their numerous advantages upon single-beam FIB systems. The segment is predicted to expand at a CAGR of 5.8% over the forecast horizon. In terms of customers, the failure analysis equipment market in the semiconductor industry is segmented into fab failure analysis (FA) labs, fabless FA labs,...